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About Regress Pro--updated October 2006Regress Pro is scientific / industrial software that can be used to study experimental data coming from spectroscopic ellipsometers or reflectometers. The program has been developed mainly looking to the application of thin film measurement in semiconductor industry. The software is suitable both to determine the thickness of the layers and to determine the optical properties of dielectric materials. Here a couple of screenshots of Regress Pro at work: Achieved Goals
Regress pro features:
User-friendly graphical user interface Library to develop
indipendent applications
The version 1.1 of Regress Pro has been recently released. The program has been tested and is currently used by the author itself. Current PlansIt is planned to add new features in Regress Pro. Most notably :
DownloadsRegress Pro is distributed under the GNU General Public License (GPL). The program use two libraries provided under the GNU Lesser General Public License (LGPL):
RequirementsThe program can be compiled both on Windows and Linux/UNIX platforms using the GCC compiler. The following libraries are needed to compile the program
Author The author of Regress Pro
is Francesco Abbate. E-mail address: .
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